Téléchargez le livre : Debug Automation from Pre-Silicon to Post-Silicon

Debug Automation from Pre-Silicon to Post-Silicon

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Éditeur :

Springer


Paru le : 2014-09-25

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Description

This book describes automated debugging approaches for the bugs and the faults which appear in different abstraction levels of a hardware system. The authors employ a transaction-based debug approach to systems at the transaction-level, asserting the correct relation of transactions. The automated debug approach for design bugs finds the potential fault candidates at RTL and gate-level of a circuit. Debug techniques for logic bugs and synchronization bugs are demonstrated, enabling readers to localize the most difficult bugs. Debug automation for electrical faults (delay faults)finds the potentially failing speedpaths in a circuit at gate-level. The various debug approaches described achieve high diagnosis accuracy and reduce the debugging time, shortening the IC development cycle and increasing the productivity of designers.Describes a unified framework for debug automation used at both pre-silicon and post-silicon stages;Provides approaches for debug automation of a hardware system at different levels of abstraction, i.e., chip, gate-level, RTL and transaction level;Includes techniques for debug automation of design bugs and electrical faults, as well as an infrastructure to debug NoC-based multiprocessor SoCs.
Pages
171 pages
Collection
n.c
Parution
2014-09-25
Marque
Springer
EAN papier
9783319093086
EAN EPUB
9783319093093
Informations sur l'ebook
Nombre pages copiables
1
Nombre pages imprimables
17
Taille du fichier
2642 Ko
Prix
52,74 €

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