Téléchargez le livre : Design for AT-Speed Test, Diagnosis and Measurement

Design for AT-Speed Test, Diagnosis and Measurement

de

,

Éditeur :

Kluwer Academic Publishers


Paru le : 1999

eBook Téléchargement DRM Adobe 🛈
120,75 €
Téléchargement immédiat
Dès validation de votre commande
Image Louise Reader présentation

Louise Reader

Lisez ce titre sur l'application Louise Reader.

badge apple Application Louise Reader
badge Android Application Louise Reader
Description

Design for AT-Speed Test, Diagnosis and Measurement is the first book to offer practical and proven design-for-testability (DFT) solutions to chip and system design engineers, test engineers and product managers at the silicon level as well as at the board and systems levels. Designers will see how the implementation of embedded test enables simplification of silicon debug and system bring-up. Test engineers will determine how embedded test provides a superior level of at-speed test, diagnosis and measurement without exceeding the capabilities of their equipment. Product managers will learn how the time, resources and costs associated with test development, manufacture cost and lifecycle maintenance of their products can be significantly reduced by designing embedded test in the product. A complete design flow and analysis of the impact of embedded test on a design makes this book a `must read' before any DFT is attempted.
Pages
n.c
Collection
n.c
Parution
1999
Marque
Kluwer Academic Publishers
EAN papier
0306475448
EAN PDF
0306475448
Informations sur l'ebook
Nombre pages copiables
1
Nombre pages imprimables
10
Taille du fichier
1445 Ko
Prix
120,75 €

Suggestions personnalisées