Téléchargez le livre : Timing Performance of Nanometer Digital Circuits Under Process Variations

Timing Performance of Nanometer Digital Circuits Under Process Variations

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Éditeur :

Springer


Collection :

Frontiers in Electronic Testing

Paru le : 2018-04-18

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Description
This book discusses the digital design of integrated circuits under process variations, with a focus on design-time solutions. The authors describe a step-by-step methodology, going from logic gates to logic paths to the circuit level. Topics are presented in comprehensively, without overwhelming use of analytical formulations.  Emphasis is placed on providing digital designers with understanding of the sources of process variations, their impact on circuit performance and tools for improving their designs to comply with product specifications.  Various circuit-level “design hints” are highlighted, so that readers can use then to improve their designs. A special treatment is devoted to unique design issues and the impact of process variations on the performance of FinFET based circuits. This book enables readers to make optimal decisions at design time, toward more efficient circuits, with better yield and higher reliability.
Pages
185 pages
Collection
Frontiers in Electronic Testing
Parution
2018-04-18
Marque
Springer
EAN papier
9783319754642
EAN PDF
9783319754659
Informations sur l'ebook
Nombre pages copiables
1
Nombre pages imprimables
18
Taille du fichier
13793 Ko
Prix
116,04 €
EAN EPUB
9783319754659
Informations sur l'ebook
Nombre pages copiables
1
Nombre pages imprimables
18
Taille du fichier
4690 Ko
Prix
116,04 €

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