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Télécharger le livre : Timing Performance of Nanometer Digital Circuits Under Process Variations
Victor Champac , Jose Garcia Gervacio
Timing Performance of Nanometer Digital Circuits Under Process Variations
This book discusses the digital design of integrated circuits under process variations, with a focus on design-time solutions. The authors describe a step-by-step methodology, going from logic gates to logic paths to the circuit level. Topics are presented in...
Editeur : Springer
Parution : 2018-04-18
Collection : Frontiers in Electronic Testing
Format(s) : PDF, ePub
116,04 €
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Télécharger le livre : Soft Errors in Modern Electronic Systems
Michael Nicolaidis
Soft Errors in Modern Electronic Systems
This book provides a comprehensive presentation of the most advanced research results and technological developments enabling understanding, qualifying and mitigating the soft errors effect in advanced electronics, including the fundamental physical mechanisms of...
Editeur : Springer
Parution : 2010-09-24
Collection : Frontiers in Electronic Testing
Format(s) : ePub
147,69 €
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Télécharger le livre : Models in Hardware Testing
Hans-Joachim Wunderlich
Models in Hardware Testing
Model based testing is the most powerful technique for testing hardware and software systems. Models in Hardware Testing describes the use of models at all the levels of hardware testing. The relevant fault models for nanoscaled CMOS technology are introduced, and their...
Editeur : Springer
Parution : 2009-11-12
Collection : Frontiers in Electronic Testing
Format(s) : ePub
94,94 €
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Télécharger le livre : Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
José Pineda De Gyvez , Manoj Sachdev
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
Defect-oriented testing methods have come a long way from a mere interesting academic exercise to a hard industrial reality. Many factors have contributed to its industrial acceptance. Traditional approaches of testing modern integrated circuits have been found to be...
Editeur : Springer
Parution : 2007-06-04
Collection : Frontiers in Electronic Testing
Format(s) : PDF
210,99 €
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Télécharger le livre : Fault-Tolerance Techniques for SRAM-Based FPGAs
Fernanda Lima Kastensmidt , Ricardo Reis
Fault-Tolerance Techniques for SRAM-Based FPGAs
Fault-tolerance in integrated circuits is not an exclusive concern regarding space designers or highly-reliable application engineers. Rather, designers of next generation products must cope with reduced margin noises due to technological advances. The continuous...
Editeur : Springer
Parution : 2007-02-01
Collection : Frontiers in Electronic Testing
Format(s) : PDF
94,94 €
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Télécharger le livre : Digital Timing Measurements
Wolfgang Maichen
Digital Timing Measurements
As many circuits and applications now enter the Gigahertz frequency range, accurate digital timing measurements have become crucial in the design, verification, characterization, and application of electronic circuits. To be successful in this endeavour, an engineer...
Editeur : Springer
Parution : 2006-10-03
Collection : Frontiers in Electronic Testing
Format(s) : PDF
147,69 €
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Télécharger le livre : The Core Test Wrapper Handbook
Francisco Da Silva , Teresa Mclaurin , Tom Waayers
The Core Test Wrapper Handbook
In the early to mid-1990's while working at what was then Motorola Se- conductor, business changes forced my multi-hundred dollar microprocessor to become a tens-of-dollars embedded core. I ran into first hand the problem of trying to deliver what used to be a whole...
Editeur : Springer
Parution : 2006-09-15
Collection : Frontiers in Electronic Testing
Format(s) : PDF
105,49 €
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Télécharger le livre : Introduction to Advanced System-on-Chip Test Design and Optimization
Erik Larsson
Introduction to Advanced System-on-Chip Test Design and Optimization
SOC test design and its optimization is the topic of Introduction to Advanced System-on-Chip Test Design and Optimization. It gives an introduction to testing, describes the problems related toSOC testing, discusses the modeling granularity and the implementation into...
Editeur : Springer
Parution : 2006-03-30
Collection : Frontiers in Electronic Testing
Format(s) : PDF
147,69 €
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Télécharger le livre : Advances in Electronic Testing
Dimitris Gizopoulos
Advances in Electronic Testing
Advances in Electronic Testing: Challenges and Methodologies is a new type of edited volume in the Frontiers in Electronic Testing book series devoted to recent advances in electronic circuits testing. The book is a comprehensive elaboration on important topics which...
Editeur : Springer
Parution : 2006-01-22
Collection : Frontiers in Electronic Testing
Format(s) : PDF
147,69 €
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