Power-Aware Testing and Test Strategies for Low Power Devices



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Springer


Paru le : 2010-03-11



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Description
Managing the power consumption of circuits and systems is now considered one of the most important challenges for the semiconductor industry. Elaborate power management strategies, such as dynamic voltage scaling, clock gating or power gating techniques, are used today to control the power dissipation during functional operation. The usage of these strategies has various implications on manufacturing test, and power-aware test is therefore increasingly becoming a major consideration during design-for-test and test preparation for low power devices. This book explores existing solutions for power-aware test and design-for-test of conventional circuits and systems, and surveys test strategies and EDA solutions for testing low power devices.
Pages
363 pages
Collection
n.c
Parution
2010-03-11
Marque
Springer
EAN papier
9781441909275
EAN EPUB
9781441909282

Informations sur l'ebook
Nombre pages copiables
3
Nombre pages imprimables
36
Taille du fichier
4680 Ko
Prix
105,49 €

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