Télécharger le livre :  Power-Aware Testing and Test Strategies for Low Power Devices
Managing the power consumption of circuits and systems is now considered one of the most important challenges for the semiconductor industry. Elaborate power management strategies, such as dynamic voltage scaling, clock gating or power gating techniques, are used today...

Editeur : Springer
Parution : 2010-03-11
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Télécharger le livre :  VLSI Test Principles and Architectures
This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume. - Most up-to-date coverage of design...

Editeur : Morgan Kaufmann
Parution : 2006-08-14
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