Télécharger le livre :  Test and Diagnosis for Small-Delay Defects
This book will introduce new techniques for detecting and diagnosing small-delay defects in integrated circuits. Although this sort of timing defect is commonly found in integrated circuits manufactured with nanometer technology, this will be the first book to introduce...

Editeur : Springer
Parution : 2011-09-08
ePub

94,94

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