Prof. Todinov’s background is Engineering, Mathematics and Computer Science. He holds a PhD and a higher doctorate (DEng) from the University of Birmingham. His name is associated with key results in the areas: Reliability and Risk, Flow networks, Probability, Statistics of inhomogeneous media, Theory of phase transformations, Residual stresses and Probabilistic fatigue and fracture.M.Todinov pioneered research on: the theory of repairable flow networks and networks with disturbed flows, risk-based reliability analysis - driven by the cost of system failure, fracture initiated by flaws in components with complex shape, reliability dependent on the relative configurations of random variables and optimal allocation of a fixed budget to achieve a maximal risk reduction.A sample of M.Todinov’s results include: introducing the hazard stress function for modelling the probability of failure of materials and deriving the correct alternative of the Weibull model; stating a theorem regarding the exact upper bound of properties from multiple sources and a theorem regarding variance of a distribution mixture; the formulation and proof of the necessary and sufficient conditions of the Palmgren-Miner rule and Scheil’s additivity rule; deriving the correct alternative of the Johnson-Mehl-Avrami-Kolmogorov equation and stating the dual network theorems for static flows networks and networks with disturbed flows.
Télécharger le livre :  Flow Networks

Repairable flow networks are a new area of research, which analyzes the repair and flow disruption caused by failures of components in static flow networks. This book addresses a gap in current network research by developing the theory, algorithms and applications...
Editeur : Elsevier Science
Parution : 2013-01-16

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80,13

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Télécharger le livre :  Risk-Based Reliability Analysis and Generic Principles for Risk Reduction

This book has been written with the intention to fill two big gaps in the reliability and risk literature: the risk-based reliability analysis as a powerful alternative to the traditional reliability analysis and the generic principles for reducing technical risk. An...
Editeur : Elsevier Science
Parution : 2006-11-03

Format(s) : epub sans DRM
163,52

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