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Télécharger le livre : Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials
Angus Kingon , Yossi Rosenwaks , Paula M. Vilarinho
Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials
As the characteristic dimensions of electronic devices continue to shrink, the ability to characterize their electronic properties at the nanometer scale has come to be of outstanding importance. In this sense, Scanning Probe Microscopy (SPM) is becoming an...
Editeur : Springer
Parution : 2006-06-15
Collection : NATO Science Series II: Mathematics, Physics and Chemistry
Format(s) : PDF
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