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Télécharger le livre : Electrical Atomic Force Microscopy for Nanoelectronics
Umberto Celano
Electrical Atomic Force Microscopy for Nanoelectronics
The tremendous impact of electronic devices on our lives is the result of continuous improvements of the billions of nanoelectronic components inside integrated circuits (ICs). However, ultra-scaled semiconductor devices require nanometer control of the many parameters...
Editeur : Springer
Parution : 2019-08-01
Collection : NanoScience and Technology
Format(s) : PDF, ePub
168,79 €
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Télécharger le livre : Metrology and Physical Mechanisms in New Generation Ionic Devices
Umberto Celano
Metrology and Physical Mechanisms in New Generation Ionic Devices
This thesis presents the first direct observations of the 3D-shape, size and electrical properties of nanoscale filaments, made possible by a new Scanning Probe Microscopy-based tomography technique referred to as scalpel SPM. Using this innovative technology and...
Editeur : Springer
Parution : 2016-06-18
Collection : Springer Theses
Format(s) : ePub
94,94 €
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