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Télécharger le livre : Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
José Pineda De Gyvez , Manoj Sachdev
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
Defect-oriented testing methods have come a long way from a mere interesting academic exercise to a hard industrial reality. Many factors have contributed to its industrial acceptance. Traditional approaches of testing modern integrated circuits have been found to be...
Editeur : Springer
Parution : 2007-06-04
Collection : Frontiers in Electronic Testing
Format(s) : PDF
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