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Télécharger le livre : Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
José Pineda De Gyvez , Manoj Sachdev
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
Defect-oriented testing methods have come a long way from a mere interesting academic exercise to a hard industrial reality. Many factors have contributed to its industrial acceptance. Traditional approaches of testing modern integrated circuits have been found to be...
Editeur : Springer
Parution : 2007-06-04
Collection : Frontiers in Electronic Testing
Format(s) : PDF
241,99 €
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Télécharger le livre : Thermal and Power Management of Integrated Circuits
Manoj Sachdev , Arman Vassighi
Thermal and Power Management of Integrated Circuits
In Thermal and Power Management of Integrated Circuits, power and thermal management issues in integrated circuits during normal operating conditions and stress operating conditions are addressed. Thermal management in VLSI circuits is becoming an integral part of the...
Editeur : Springer
Parution : 2006-06-01

Format(s) : PDF
96,29 €
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